Special Issue on: Sparsity driven methods in medical ultrasound
(Submission deadline: February 28, 2017)
Ultrasound signal processing has been traditionally based on the hypothesis of Gaussianity justified by the central limit theorem. This paradigm has been questioned in the early 2000s. Instead, the concept of sparsity has gained interest, motivated by various non-Gaussian or heavy-tailed statistical models proven to be adapted to ultrasound signals. Moreover, the emergence of compressed sensing techniques a few years ago has strengthened the interest of sparsity based methods in medical ultrasound.
To share these concepts and the associated methods with the UFFC community, IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control will organize a special issue on “Sparsity driven methods in medical ultrasound”. This special issue seeks contributions from authors who are engaged in theoretical studies and developments related to the concept of sparsity in ultrasound imaging, as well as related applications, including, but not limited to,
- Compressed sensing
- Computed tomography
- Image restoration
- Doppler ultrasound
All contributions should be submitted to IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control via Manuscript Central at https://mc.manuscriptcentral.com/tuffc-ieee. When submitting, authors should select the Manuscript Type as “Special Issue Papers” or “Special Issue Review”, and enter the name of this special issue in the field “If the manuscript type is ‘Special Issue’, please enter the name of the Special Issue”. It is important that your manuscript is distinguished from a regular submission. In the first paragraph of “Comments to Editor-in-Chief”, you should state that the submission is intended for the Special Issue on Sparsity driven methods in medical ultrasound. Instructions for preparation and submission of your manuscript may be found on the IEEE Transactions on UFFC website: click here.
All manuscripts are subject to the normal peer-review process. The submission deadline is February 28, 2017 with an expected publication date in the second half of 2017.
The guest editors will be:
Department of EE Technion,
Israel Institute of Technology
University of Toulouse / IRIT
INSA / CREATIS